Applied Physics
SQUID Magnetometer MPMS-XL (Quantum Design)
- 7 Tesla magnet
- AC susceptibility
- Sample rotator
- Resistivity and Hall effect package
- Location: Low temperature laboratory / Nanotalo
Ambient AFM/STM (Nanoscope III)
- Morfology of sample surface, adhesion force measurements
- Measurements at ambient pressure in controlled gas composition and humidity
- Maximum sample size 5 mm x 5 mm
- Maximum scanning range 100 μm (lateral), 6.8 μm (vertical)
- Resolution in STM mode 0.5 (lateral), 0.1 (vertical)
- Resolution in AFM mode 1 (vertical) and laterally depending on the probe diameter
Contact person: Jouko Lahtinen / Fysiikan laboratorio
UHV STM (RHK750VT)
- Morfology of sample surface
- Measurements in ultra high vacuum
- Sample diameter about 10 mm
- Maximum scanning range 8 μm (lateral), 1 μm (vertical)
- Resolution 0.5 (lateral), 0.05 (vertical)
Contact person: Jouko Lahtinen / Fysiikan laboratorio
More information: http://www.fyslab.hut.fi/surface/facilities.html
XPS/ESCA (SSX-100)
- Detection of composition and chemical states of the elements within topmost 10 nm from the surface
- Detection limit around 0.1 %
- Depth analysis upto 5 μm using Ar-ion sputtering
- Measurements in ultra high vacuum
- Sample treatment in controlled atmosphere upto 1 atm and upto 500 C prior to the measurements
Contact person: Jouko Lahtinen / Fysiikan laboratorio
More information: http://www.fyslab.hut.fi/surface/facilities.html
Veeco Dektak6M Stylus Profiler
- Step height and surface roughness measurements. Applicable for routine measurements of non-clean-room-compatible solid samples.
- Maximum sample thickness 31.75 mm
- Vertical range 262 microm.
- Vertical resolution 1 Å at 65 kÅ range, 40 Å at 655 kÅ and 40 Å at 2620 kÅ
- Scan length range 50 microm. to 30 mm
- Stylus tip 12.5 microm., changeable
- Stylus force 1 - 15 mg, programmable
- Color video camera with manual zoom optics 70-280X
Contact person Janne Halme / Energiatieteet
More information: www.tkk.fi/Units/AES/projects/renew/
Bruker NanoStar SAXS
Small-Angle-X-ray-Scattering.
- Bruker NanoStar micro-focus Rotating anode.
- Bruker Hi-Star 2D detector 1024*1024 pix.
- Sample to Detector distance: 10 cm - 600 cm (800cm). Corresponding crystal lattice size 0.3 nm upto 500nm.
- Fully automatic sample robotics (60 samples) . Samples either in vacuum, air or nitrogen etc..
- Heating/cooling possibility (also multiple samples). In-situ rheology/SAXS.
- Later available GISAXS for thin films.
Contact person Janne Ruokolainen / Optiikka ja molekyylimateriaalit.
More information: omm.hut.fi 
Tecnai 2G Bio Twin TEM
Especially for soft-matter analysis.
- Two CCD-cameras:
- 1392*1040 px for diffraction- and low magnification work.
- Microscopic camera 2048*2048 px for higher resolution work.
- Sampleholders: Multiple specimen holder (4 samples), Double tilt, Single tilt, Cryo-transfer multiple (3 samples). Tomography software.
Contact person Janne Ruokolainen / Optiikka ja molekyylimateriaalit.
More information: omm.hut.fi 
Sample preparation
- Sample trimmer: Leica EM Trim.
- Ultramicrotome: Leica 125 UCT with cryo: Leica EM FC S.
- Sputter: Emitech K950X: C- and metalsputtering, glow discharge unit.
Contact person Janne Ruokolainen / Optiikka ja molekyylimateriaalit.
More information: omm.hut.fi 
Nicolet 380 FT-IR Spectrometer
- Heating/cooling.
Contact person Janne Ruokolainen / Optiikka ja molekyylimateriaalit.
More information: omm.hut.fi 
Perkin Elmer Lambda 950
UV/Vis/NIR Spectrometer.
- Wavelengths 190 - 3200 nm, with integrating sphere 190 - 2600 nm.
- Heating/cooling.
- Goniometer.
Contact person Janne Ruokolainen / Optiikka ja molekyylimateriaalit.
More information: omm.hut.fi
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