X-ray instruments

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PANalytical X'Pert PRO MPD Alpha-1 XRD
(ICDD PDF4+ database)

• Monochromator + focusing beam geometry for Cu K(alpha1) radiation: ideal for high-resolution powder diffraction analysis (XRPD) (indexing, Rietveld refinement). Also K(alpha) mode in use
• X-ray mirror + collimator for parallel Cu Ka radiation: grazing incidence diffraction (GIXRD) and reflectivity (XRR) on thin films and surfaces (phase identification, thickness and roughness).
• PDF4+ has 285 402 data sets (114 630 with atomic coordinates)

Bruker NanoStar SAXS

Small-Angle-X-ray-Scattering.

• Bruker NanoStar micro-focus Rotating anode.
• Bruker Hi-Star 2D detector 1024*1024 pix.
• Sample to Detector distance: 10 cm - 600 cm (800 cm). Corresponding crystal lattice size 0.3 nm upto 500 nm.
• Fully automatic sample robotics (60 samples) . Samples either in vacuum, air or nitrogen etc..
• Heating/cooling possibility (also multiple samples). In-situ rheology/SAXS.
• Later available GISAXS for thin films.

Contact person Janne Ruokolainen / Optiikka ja molekyylimateriaalit.

More information: omm.hut.fi

PANalytical X'Pert PRO MRD

High resolution x-ray diffraction system.

• Cu x-ray tube. (1-7 crystals).
• Applications:
• • Texture analysis
  • Stress analysis
  • Thin film analysis, XRR (Thickness and surface roughness)
  • Crystalstructure analysis
• max 6" wafer.

Contact person Pasi Kostamo / Optoelektroniikan laboratorio.

More information: atomi.hut.fi/facilities.php

Fein-Focus FXS-160.24 Transmission x-ray

• Voltage range: 10-160 kV.
• Current range: 0.01-1 mA.
• Magnification (geometrical) 1000x, Total 2200x.
• Detail detectability < 2 μm.

Contact person doc. Kari Lounatmaa / Elektroniikan valmistustekniikan laboratorio.

More information: www.ept.hut.fi/Facilities

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