Electrical measurements

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WT-85X 400 Lifetime scanner

• Method for the spacial measurement of bulk minority carrier recombination lifetime.
• Kelvin-probe for surfacepotential measurements.
• More information about the device.

Contact person Hele Savin / Elektronifysiikan laboratorio.

More information: Link to equipment list

DLS-83D Deep Level Spectrometer (DLTS)

• Deep impurities in semiconductors.
• More information about the device.

Contact person Hele Savin / Elektronifysiikan laboratorio.

More information: Link to equipment list

Hall-measurement system + cryostat

• T range 8 K - 300 K
• Semiconductor carrier concentration and mobility as a function of temperature and magnetic field (max. 1.3 T).
• More information about the device.

Contact persons: Sergey Novikov ja Heikki Holmberg / Elektronifysiikan laboratorio.

More information: Link to equipment list

Probe-station

• I-V and C-V measurements for semiconductor devices.
• HP4155A Semiconductor parameter analyser and HP4192A LF impedance analyser.

Contact person Antti Haarahiltunen / Elektronifysiikan laboratorio.

More information: Link to equipment list